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二硫化鉭晶體(2H) TaS2(Tantalum Sulfide) -2H
晶體尺寸：~10毫米
電學(xué)性能：Metal, Charge density waves (CDW) system below ~75K, Superconductor with Tc ~1K
金屬、電荷密度波(CDW)
晶體結(jié)構(gòu)：六邊形
晶胞參數(shù)：a = b = 0.331 nm, c = 1.207 nm, α = β = 90, γ = 120°
晶體類型：合成
晶體純度：＞99.995%
X-ray diffraction on a 2H phase Tantalum Disulfide single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 4 XRD peaks correspond, from left to right, to (00l) with l = 2, 4, 6, 8
Powder X-ray diffraction (XRD) of a single crystal 2H-TaS2. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
Stoichiometric analysis of a single crystal 2H-TaS2 by Energy-dispersive X-ray spectroscopy (EDX).
Raman spectrum of a single crystal 2H-TaS2. Measurement was performed with a 785 nm Raman system at room temperature.
聯(lián)系人：陳谷一
地址：江蘇省泰州市鳳凰西路168號(hào)
郵箱：taizhou@sunano.com.cn
電話：021-56830191
